silicon wafers

• Self - assembly of silica photonic crystals inside micro - channel on silicon wafer
  硅槽内自组装二氧化硅光子晶体
• Contamination particulate - particles found on the surface of a silicon wafer
  沾污颗粒-晶圆片表面上的颗粒。
• Contamination particulate - particles found on the surface of a silicon wafer
  沾污颗粒-晶的上面表片圆颗粒。
• Test method for detection of oxidation induced defects in polished silicon wafers
  硅抛光片氧化诱生缺陷的检验方法
• Effect of substrate orientation on microstructure of hydrogen - implanted silicon wafers
  面向对注氢硅片中微结构的影响
• Methods of measurement of thickness , thickness variation and bow for silicon wafer
  硅片厚度厚度变化及弯曲的测量方法
• Test method for measuring resistivity of silicon wafers using spreading resistance probe
  硅片电阻率测定扩展电阻探针法
• An improved angle polishing method for measuring subsurface damage in silicon wafers
  一种改进的测量硅片亚表面损伤的角度抛光方法
• Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
  用四点探针法对硅晶体和硅片电阻率的测试方法
• Test wafer - a silicon wafer that is used in manufacturing for monitoring and testing purposes
  测试晶圆片-用于生产中监测和测试的晶圆片。